Physically Unclonable Function on NAND Flash Memory




Abstract: We investigate how to provide the functionality of physically unclonable function (PUF) using NAND flash memory and demonstrate its feasibility using commercial 3-D NAND flash memory devices. In particular, we propose a scheme to improve the reliability of PUF and to reduce the probability of malfunction by applying a simple error correcting code. We confirm our claim by conducting experiments with 3-D NAND flash memory devices.

Bio: Sangha Lee received the B.S. degree and the M.S. degree in electrical engineering from Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea, in 2011 and 2013, respectively. He is currently pursuing the Ph.D. degree in electrical engineering at KAIST. Since 2011, he has been a Member of the Coding and Communications Laboratory, KAIST. His research interests include coding theory and signal processing for data storage systems.